XJP-405 industrial microscope is equipped with a large moving range mechanical stage, Epi-illuminator, long working distance bright and dark field Infinite Plan objectives, wide field eyepiece with clear images and good contrast. It is developed and aimed at the semiconductor industry, wafer manufacturing, electronic information industry, metallurgical industry, and used as a high-grade industrial microscope. Bright ＆ Dark-field observation, EPI-polarizing, and DIC observation can proceed. It is widely used in Factories, Research institution and college and Universities to identify and analyze Wafer, FPD, Circuit substrate, Precision molds.
Compensation Free Trinocular Head, Inclined 30°（50mm-75mm）
WF10×/20mm,crosshair with reticule 0.1mm
Quintuple Nosepiece with DIC Jack
Long working distance bright and dark field Infinite Plan objectives:
5 ×/0.1B.D/W.D.29.4mm 10×/0.25B.D/W.D.16mm 20×/0.40B.D/W.D.10.6mm 40
Double layer mechanical stage
Stage Size: 350mm×310mm
Flashboard type filters(green,blue,neutral)
Coaxial coarse ＆fine focusing adjustment With rack and pinion mechanism Fine
focusing scale value 0.002mm
Epi-illumination: With aperture iris diaphragm and field iris Diaphragm, Halogen
Bulb 12V/100W, AC85V-230V, Brightness Adjustable
Analyzer rotatable 360,°Polariaer＆Analyzer can be moved in/out of the optical path
1.3Mega、2.0 Mega、3.0 Mega、5.0 Megapixels CMOS Digital camera eyepiece
Long working distance bright and dark field Infinite Plan objectives: 50
Two-dimensional measurement software
Professional metallurgical image analysis software
Photography attachment and CCD Adapter 0.5×、0.57×、0.75×
CCD Camera,colour 1/3″High resolution 520 TV lines
1.Adopt US High-1. 1.Adopt UIS High-resolution, Long working distance, and infinity light path correcting system objective imaging technology
2.Extending the multiplexing technology of objective, compatible infinity objective with all the observation methods. including brigh＆ dark field observation, polarization and also provide with high clear and sharp image in each observation method.
3.Aspherical surface Kohler illumination, increasing the viewing brightness.
4.WF10 X（Φ25）super wide field Eyepiece, long working distance metallurgical objective with bright and dark field
5.The Nosepiece can be equipped with detachable DIC differential interference device.