Description

Description

  • XJL-302  upright metallurgical microscope is suitable to observe surfaces of the opaque object. It is equipped excellent UIS optical system and modularization function design so that update system expediently and achieved polarization, darkfield observation. Compact and steady main frame body is the embodiment for the shock resistance. The ideal ergonomic design is adopted in this unit and has the easier operation and wider space. This is the ideal optical instrument for micro observation in metallographic structure and surface morphology. It is suitable for research in metallography, mineralogy, precision engineering, etc.
    Features
    ▲  With long working distance plan achromatic objectives  (no cover glass) and wide-field eyepieces, can get clear pictures and wide view field
    ▲  With large move range mechanical stages, moving range:8″X8″(204mmX204mm)
    ▲  Coaxial coarse/fine focus system, with tensional adjustable and up stop, minimum division of fine focusing: 0.8μm
    ▲  6V 30W halogen lamp, adjustable brightness
    ▲  Trinocular, can switch to normally/polarize observation, brightfield/darkfield observation. can send 100% of light to the binocular eyepieces or to the top port
Specification
  • Standard Configuration

    Specification
    Eyepiece
     Wide field WF10X(field number: Φ22mm) 
    Infinity plan achromatic objective
    XJL-302
    £¨Equipped with bright field objectives£©
    PL L5X/0.12  (Work distance):26.1 mm
    PL L10X/0.25  (Work distance):20.2 mm
    PL L20X/0.40  (Work distance):8.80 mm
    PL L50X/0.70  (Work distance):3.68 mm
    PL L80X/0.80  (Work distance):1.25 mm
    XJL-302BD
    £¨Equipped with bright & darkfield objectives£©
    PL L5X/0.12 BD  (Work distance):8.05mm
    PL L10X/0.25 BD  (Work distance):7.86mm
    PL L20X/0.40 BD  (Work distance):7.23mm
    PL L50X/0.70 BD  (Work distance):1.75mm
    PL L80X/0.80 BD (Work distance):1.25 mm  
    Eyepieces tube
    Trinocular inclined 30˚, can be shot in 100% light flux.
    Epi-illumination system
    XJL-302
    6V30W halogen and brightness enable control
    XJL-302BD
    12V50W halogen and brightness enable control
    Integrated field diaphragm, aperture diaphragm and (Y,B,G, ground glass) switching device. Push-pull type analyzer and polarizer.
    Focus system
    Coaxial coarse/fine focus system, with tension adjustable and limit stopper, minimum division of fine focusing: 0.7μm.
    Nosepiece
    Quintuple (Backward ball bearing inner locating)
    Stage
    Mechanical stage£¬overall size:280mmX270mm£¬moving range: 204mmX204mm