Description
- XJL-20/20BD Inverted metallurgical microscope is equipped excellent UIS optical system and modularization function design so that update system expediently and achieved polarization, darkfield observation. Compact and steady main frame body is the embodiment for the shock resistance. The ideal ergonomic design is adopted in this unit and has an easier operation and wider space. This is the ideal optical instrument for micro observation in metallographic structure and surface morphology. It is suitable for research in metallography, mineralogy, precision engineering, etc.
Specification
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SpecificationEyepieceWide field WF10X(field number: Φ22mm)ObjectiveXJL-20Equipped with bright field objectivesPL L10X/0.25 (Work distance)：5 mmPL L20X/0.40 (Work distance)：8.80 mmPL L50X/0.70 (Work distance)：3.68 mmPL L100X/0.85（Dry） (Work distance)：0.40 mmXJL-20BDEquipped with bright & darkfield objectivesPL L5X/0.12 BD (Work distance)：8.05mmPL L10X/0.25 BD (Work distance)：7.86 mmPL L20X/0.40 BD (Work distance)：7.23mmPL L50X/0.70 BD (Work distance)：2.50mmEyepiece tubeInclination angle is 45˚ and interpupillary distance is 53~75mm.Focus systemCoaxial coarse/fine focus, with tension adjustable，minimum division of fine focusing, is 2μm.NosepieceQuintuple (Backward ball bearing inner locating)StageMechanical stage overall size: 242mmX200mm and moving range: 30mmX30mm.Rotundity and rotatable stage size: maximal measurement is Ф130mm and minimal clear aperture is less then Ф20mm.Illumination system6V30W halogen and brightness enable control., use in XJL-2012V50W halogen and brightness enable control., use in XJL-20BDIntegrated field diaphragm, the aperture diaphragm, and puller type polarizer.Equipped with frosted glass and yellow, green and blue filters
