Description

Description

  • XJL-302 DIC differential interference contrast microscope is suitable to observe many different kinds of object. It is equipped with transmitted illuminator and reflected DIC system, infinity plan achromatic objectives with long working distance, wide-field eyepieces, and polarizer device. It provides the clear and 3D image, beautiful sculpt, convenient control, etc. It is the ideal instruments in research work in biology, metallography, mineralogy, precision engineering, electronics, etc.






     
Specification
  • Standard Configuration
  • Eyepiece
    SWF 10X Wide-field plan achromatic eyepiece field of view number Ф22mm
    Objective (Infinity and long working distance plan achromatic objective)
    Type
    Magnification
    Number aperture
    Working distance (mm)
    Thickness of cover glass (mm)
    Remark
     
    Bright Field objective
     
    LMPlan5X
    0.12
    18.2
    0
    XJL-302DIC
    LMPlan10X
    0.25
    20.2
    0
    LMPlan20X
    0.35
    6.0
    0
    50X
    0.70
    3.68
    0
    80X
    0.80
    1.28
    0
    Eyepiece tube
    Inclination of 30˚ and interpupillary distance is 53~75mm
    Focusing system
    Coaxial coarse/fine focus, with tension adjustable and up stop minimum division of fine focusing: 0.8μm
    Nosepiece 
    Quintuple (Backward ball bearing inner locating)
    Stage 
    Mechanical stage£¬size:280mmX270mm£¬moving range: 204mmX204mm
    Polarization Unit
    Polarizer enable 360° to rotate and switched in or out
    Analyzer can be switched in or out
    Light source
    12V50W halogen, brightness enable control
    DIC observation system
    Suitable to 5X/10X/20X objective