Description
- XJL-302 DIC differential interference contrast microscope is suitable to observe many different kinds of object. It is equipped with transmitted illuminator and reflected DIC system, infinity plan achromatic objectives with long working distance, wide-field eyepieces, and polarizer device. It provides the clear and 3D image, beautiful sculpt, convenient control, etc. It is the ideal instruments in research work in biology, metallography, mineralogy, precision engineering, electronics, etc.
Specification
- Standard Configuration
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EyepieceSWF 10X Wide-field plan achromatic eyepiece field of view number Ф22mmObjective (Infinity and long working distance plan achromatic objective)TypeMagnificationNumber apertureWorking distance (mm)Thickness of cover glass (mm)RemarkBright Field objectiveLMPlan5X0.1218.20XJL-302DICLMPlan10X0.2520.20LMPlan20X0.356.0050X0.703.68080X0.801.280Eyepiece tubeInclination of 30˚ and interpupillary distance is 53~75mmFocusing systemCoaxial coarse/fine focus, with tension adjustable and up stop minimum division of fine focusing: 0.8μmNosepieceQuintuple (Backward ball bearing inner locating)StageMechanical stage£¬size:280mmX270mm£¬moving range: 204mmX204mmPolarization UnitPolarizer enable 360° to rotate and switched in or outAnalyzer can be switched in or outLight source12V50W halogen, brightness enable controlDIC observation systemSuitable to 5X/10X/20X objective