XJL-20DIC Differential Interference Contrast Metallurgical Microscope

Description

XJL-20DIC Differential Interference Contrast Metallurgical Microscope are suitable for differential-interference -contrast-observation in the surface of un-transparent object . It equipped excellent UIS optical system and the notion of modularization function design, provide excellent optical performance and the update of the system. The product has beautiful configuration, easy operation, clear image, so it is the perfect research instrument for detection and analytic of the precision engineering,etc.

Specification

Specification
Eyepiece	Achromatic wide field SWF10X(Φ22mm)
Objective	Infinity plan achromatic objectives with long working distance(no cover glass)
	LMPlan5X/0.12DIC Work distance：18.2 mm
	LMPlan10X/0.25DIC Work distance：20.2 mm
	LMPlan20X/0.35DIC Work distance：6.0 mm
	PL L50X/0.70 Work distance：3.68 mm
DIC push-pull group	Suitable for LMPlan5X、10X、20X DIC objective
Eyepiece tube	Inclination 45°and interpupillary distance:53~75mm
Focus system	Coaxial coarse/fine focus with tension adjustable and up stop, minimum division of fine focusing:2.0μm.
Nosepiece	Quintuple(backward ball beaing inner locating)
Stage	Mechanical stage,size：242mmX200mm，moving range: 30mmX30mm.
Stage	Rotundity and rotatable stage size：Ф130mm minimal clear aperture is less then Ф20mm
Illumination system	12V50W halogen lamp，brightness adjustable
	Integrated field diaphragm, aperture diaphragm, and system polarizer
	Equipped with frosted glass and yellow, green and blue filters

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