XJL-20DIC Differential Interference Contrast Metallurgical Microscope

Description
  • XJL-20DIC Differential Interference Contrast Metallurgical Microscope  are suitable for differential-interference -contrast-observation in the surface of un-transparent object . It equipped excellent UIS optical system and the notion of modularization function design, provide excellent optical performance and the update of the system. The product has beautiful configuration, easy operation, clear image, so it is the perfect research instrument for detection and analytic of the precision engineering,etc.




Specification
  • Specification
    Eyepiece
    Achromatic wide field SWF10X(Φ22mm)
    Objective
    Infinity plan achromatic objectives with long working distance(no cover glass)
    LMPlan5X/0.12DIC Work distance18.2 mm
    LMPlan10X/0.25DIC Work distance20.2 mm
    LMPlan20X/0.35DIC Work distance6.0 mm
    PL L50X/0.70  Work distance3.68 mm
    DIC push-pull group
     Suitable for LMPlan5X10X20X DIC objective
    Eyepiece tube
    Inclination 45°and interpupillary distance:53~75mm
    Focus system
    Coaxial coarse/fine focus with tension adjustable and up stop, minimum division of fine focusing:2.0μm.
    Nosepiece
    Quintuple(backward ball beaing inner locating)
    Stage
    Mechanical stage,size242mmX200mmmoving range: 30mmX30mm.
    Rotundity and rotatable stage sizeФ130mm minimal clear aperture is less then Ф20mm
    Illumination system
    12V50W halogen lampbrightness adjustable
    Integrated field diaphragm, aperture diaphragm, and system polarizer
    Equipped with frosted glass and yellow, green and blue filters

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