Description
- L3230DIC Differential Interference Contrast Metallurgical microscopes are suitable for differential-interference -contrast-observation in the surface of un-transparent object and micro-observation in the transparent object. It equipped excellent UIS optical system and the notion of modularization function design, provide excellent optical performance and the update of the system. The product has the beautiful configuration, easy operation, clear image, so it is the perfect research instrument for detection and analytic of the precision engineering, etc.
Specification
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Standard ConfigurationModelL3230DICEyepieceAchromatic wide field SWF10X(Φ22mm)ObjectiveInfinity plan achromatic objectives with long working distance (no cover glass)LMPlan5X/0.12 Work distance:18.2 mmLMPlan10X/0.25 Work distance:20.2 mmLMPlan20X/0.35 Work distance:6.0 mmPL L40X/0.60 (spring) Work distance:3.98 mmDIC observation system5X/10X/20X DIC push-pull groupEyepieces tubeTrinocular, Inclination of 30˚,BrinocularEpi- illumination system12V 50W, halogen lamp, adjustable brightnessIntegrated field diaphragm, aperture diaphragm and (Y,B,G, ground glass) switching device. Push-pull type analyzer and polarizer.Focus systemCoaxial coarse/fine focus system, with tension adjustable and limit stopper, minimum division of fine focusing: 2μm.NosepieceQuintuple (Backward ball bearing inner locating)StageDouble layer mechanical (Size:210mmX140mm,moving range:63mmX50mm)Transmitted illuminationsystemAbbe condenser NA.1.25 Rack & pinion adjustableBlue filter and Ground glassCollector for halogen lamp illumination and integrated field diaphragm12V 30W halogen lamp, adjustable brightness
