XJP-403J Series Metallurgical Microscope

This series microscope is widely used in observation & analysis of metallurgical organization in the Mechanical industry, Research of Geological & Mineral department and viewing & measuring crystal, integrate circuit, microelectronics, etc in Electronic industry. It is the first choice of Factories, Academy, Scientific research organization contrast image. Novel figure and superior craftsmanship keep abreast of the tidal current much more.
Humanized configuration design and simple operation, Let you release from the pressure of heavy work.

Specification
Model
XJP-403J
XJP-403JT
XJP-403JA
XJP-403JAT
Viewing head
Compensation Free Binocular Head. Inclined
at 45 ° ( 50mm -75mm )
 
 
Compensation Free Trinocular Head.
Inclined at 45 ° ( 50mm -75mm )
 
 
Eyepiece
WF10X/20mm
   
WF10X/ 22mm
   
WF10X/20mm with reticule 0.1mm
Nosepiece
Quadruple nosepiece
   
Quintuple nosepiece
   
Objective
195 metallurgical
objectives
4X/0.1W.D.25mm
   
10X/ 0.25W.D .11mm
20X/0.4W.D .9mm
40X/0.6W.D. 3.8mm
Infinity metallurgical
objectives
4X/0.1W.D.25mm
   
10X/ 0.25W.D .12mm
20X/0.4W.D .10mm
40X/0.6W.D. 7.1mm
50X/0.75W.D. 1.9mm 80 (S)X/0.9W.D. 0.9mm
Stage
Double layers mechanical stage
Stage size: 242mm × 172mm
Central stage: Φ110mm
Moving range: 75mm × 50mm
Focusing
Coaxial coarse & fine focusing adjustment  with
rack and pinion mechanism Fine focusing scale
Value 0.002mm
Illumination
Epi-Kohler illumination. With aperture
iris diaphragm and field iris diaphragm.
12V/30W.AC85V-230V Adjustable brightness
Filter
Blue, green, yellow
Polarizing outfit
Analyzer rotatable 360 ° ,polarizer & Analyzer
can be slid in/out of the optical path
Checking tool
0.01mm micrometer
Optional Accessory
1.3、2.0、3.0、5.0 Megapixels CMOS electronic eyepiece
Photography attachment

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